Plasma-enhanced
chemical vapor deposition (PE-CVD) of graphene
layers on dielectric substrates is one of the most important processes
for the incorporation of graphene in semiconductor devices. Graphene
is moving rapidly from the laboratory to practical implementation;
therefore, devices may take advantage of the unique properties of
such nanomaterial. Conventional approaches rely on pattern transfers
after growing graphene on transition metals, which can cause nonuniformities,
poor adherence, or other defects. Direct growth of graphene layers
on the substrates of interest, mostly dielectrics, is the most logical
approach, although it is not free from challenges and obstacles such
as obtaining a specific yield of graphene layers with desired properties
or accurate control of the growing number of layers. In this work,
we use density-functional theory (DFT) coupled with ab initio molecular
dynamics (AIMD) to investigate the initial stages of graphene growth
on silicon oxide. We select C2H2 as the PE-CVD
precursor due to its large carbon contribution. On the basis of our
simulation results for various surface models and precursor doses,
we accurately describe the early stages of graphene growth, from the
formation of carbon dimer rows to the critical length required to
undergo dynamical folding that results in the formation of low-order
polygonal shapes. The differences in bonding with the functionalization
of the silicon oxide also mark the nature of the growing carbon layers
as well as shed light of potential flaws in the adherence to the substrate.
Finally, our dynamical matrix calculations and the obtained infrared
(IR) spectra and vibrational characteristics provide accurate recipes
to trace experimentally the growth mechanisms described and the corresponding
identification of possible stacking faults or defects in the emerging
graphene layers.