2004
DOI: 10.1016/j.surfcoat.2003.08.008
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Atmospheric pressure PE-CVD of silicon based coatings using a glow dielectric barrier discharge

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Cited by 77 publications
(44 citation statements)
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“…When a few ppmv of SiH 4 are injected with N 2 and few 100 ppmv of N 2 O in the plasma reactor, a SiO x layer is formed on the dielectric materials. Chemical pathways from Silane to SiO x have been identified and modelled in low pressure rf-plasmas [10] and are similar at atmospheric pressure [2]. With SiH 4 , aerosol concentration downstream of the DBD (~10 8 cm -3 ) is higher than for physical nucleation alone, proving that a portion of the particles detected arises from reactive nucleation.…”
Section: Reactive Nucleation From Plasma-silane Interaction For Thin Film Depositionmentioning
confidence: 85%
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“…When a few ppmv of SiH 4 are injected with N 2 and few 100 ppmv of N 2 O in the plasma reactor, a SiO x layer is formed on the dielectric materials. Chemical pathways from Silane to SiO x have been identified and modelled in low pressure rf-plasmas [10] and are similar at atmospheric pressure [2]. With SiH 4 , aerosol concentration downstream of the DBD (~10 8 cm -3 ) is higher than for physical nucleation alone, proving that a portion of the particles detected arises from reactive nucleation.…”
Section: Reactive Nucleation From Plasma-silane Interaction For Thin Film Depositionmentioning
confidence: 85%
“…The gas flow rate between the plates was adjusted between 2 and 4 L/min by mass flow controllers, leading to transit time and gas velocity in the reactor between 9, 18 ms and 1.6, 3.3 m.s -1 respectively. The experimental setup is detailed in [2]. The aerosol particle concentrations downstream of the DBD reactor were measured using a Condensation Particle Counter (CPC).…”
Section: Figure 1: Experimental Setupmentioning
confidence: 99%
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“…While HMDSO represents a more complex molecular structure than silane monomers previously discussed, it is possible that the particulate formation mechanisms identified from studies of low pressure silane deposition also take place during particulate formation from siloxane monomers. Martin et al [38] investigated atmospheric plasma deposition of SiO 2 films from SiH 4 and N 2 O mixtures and concluded that particulate nucleation followed by growth occurred due to either neutral or ionized monosilicon radicals. In the step growth processes for particulate nucleation outlined in the literature, [12,39,40] three stages are identified; (i) initiation and rapid growth of particulates up to 2 nm due to formation of heavy negative ions, (ii) secondary growth due to particulate coagulation caused by negative ion attachment and positive ion attachment, and (iii) saturation of particulate growth.…”
Section: Hmdso -5 ML Min à1 Depositionmentioning
confidence: 99%
“…Atmospheric pressure dielectric barrier discharge (DBD) techniques have been developed over the past few years and used for the production of silicon-based thin films from silane or organosilicon precursors [20]- [28], and recent studies have demonstrated the ability to produce a large panel of siliconbased coatings in a Townsend DBD at atmospheric pressure, depending on the amount of oxidizing gas added in the mixture [26], [28]- [30]. However, these PECVD techniques have never been studied for the production of conformal thin films in trenches.…”
Section: Introductionmentioning
confidence: 99%