1995
DOI: 10.1016/s1353-4858(98)90068-x
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AT&T IVES

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Cited by 13 publications
(21 citation statements)
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“…the electron beam penetration and the absorption of generated X-rays. Therefore we used a standard iterative ZAF (atomic number, absorption and fluorescence) correction procedure as implemented in the CITZAF package 15 to give accurate atomic concentrations, which are summarized in Table I. The quantitative result for the polished surface is in good agreement with the nominal atomic concentration (i.e.…”
Section: Edx Analysismentioning
confidence: 91%
“…the electron beam penetration and the absorption of generated X-rays. Therefore we used a standard iterative ZAF (atomic number, absorption and fluorescence) correction procedure as implemented in the CITZAF package 15 to give accurate atomic concentrations, which are summarized in Table I. The quantitative result for the polished surface is in good agreement with the nominal atomic concentration (i.e.…”
Section: Edx Analysismentioning
confidence: 91%
“…Calibration standards used were well-characterized natural and synthetic materials, including YAG (Al, Y), wollastonite (Si), monazite (P), Fe 2 O 3 (Fe), CeAl 2 (Ce), REE silicate glasses (lanthanides except Ce), crocoite (Pb), Th metals (Th), and UO 2 (U). The CITZAF routine in the JEOL software, which is based on the Φ(ρZ) method, [14] was used for data processing. The results were corrected for rare-earth element (REE) peak overlaps.…”
Section: Methodsmentioning
confidence: 99%
“…The detection limit for Zr is about 45 lg g -1 and between 40 and 120 lg g -1 for the other elements measured. The CITZAF package (Armstrong 1995) was applied for automated matrix correction. During all analyses, Si was used as a monitoring element for identification of micro-inclusions such as zircon, which would yield measurements with anomalously high Zr contents.…”
Section: Electron Probe Microanalysismentioning
confidence: 99%