2015
DOI: 10.1016/j.nimb.2015.03.022
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Asymmetry in generation of near-surface X-rays by 33MeV electrons at grazing interaction with a thin Si plate in magnetic field

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Cited by 6 publications
(5 citation statements)
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“…Radiation effects caused by the surface channeling were also observed at grazing incidence of the electrons on the surface of silicon crystal placed into a betatron chamber [8]. However, the theory developed in this paper is not applicable in this case because interaction of negatively charged particles with the surface is more complicated.…”
Section: Resultsmentioning
confidence: 89%
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“…Radiation effects caused by the surface channeling were also observed at grazing incidence of the electrons on the surface of silicon crystal placed into a betatron chamber [8]. However, the theory developed in this paper is not applicable in this case because interaction of negatively charged particles with the surface is more complicated.…”
Section: Resultsmentioning
confidence: 89%
“…The dynamics of the beam in an accelerator at its interaction with a radiator which is thin in profile and extended along the beam, in case of grazing incidence geometry is not investigated in accelerator physics. An effect of asymmetric generation of the X-ray radiation produced at grazing interaction of 33 MeV electrons with 50 mm Si plate in a magnetic field have recently been observed in experiments reported in [8].…”
Section: Introductionmentioning
confidence: 89%
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“…Radiation effects caused by the surface channeling were observed at grazing incidence of the electrons on the surface of silicon crystal placed into a betatron chamber [9]. However, the theory developed in this paper is not applicable in this case.…”
Section: Discussionmentioning
confidence: 91%
“…An effect of asymmetric generation of the X-ray radiation produced at grazing interaction of 33 MeV electrons with 50 mm Si plate in a magnetic field have recently been observed in experiments reported in [9]. The crystal plate of length 4 mm http://dx.doi.org/10.1016/j.nimb.2015.08.077 0168-583X/Ó 2015 Elsevier B.V. All rights reserved.…”
Section: Introductionmentioning
confidence: 97%