Abstract:Muller C-elements are considered as a main component of in asynchronous circuits. The traditional implementations of C-elements require an accurate transistor sizing as it is based on some specific current driving assumptions. Due to process variability at nano-scale technology node, such constraints cannot be guaranteed which may lead to malfunction of C-elements. In this paper, we carry out a thorough vulnerability analysis of Muller C-element under process variations at nano-scale technology nodes introduci… Show more
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