Assessment of a new ZnO:Al contact to CdZnTe for X- and gamma-ray detector applications

Abstract

The large mismatch of the coefficients of thermal expansion (CTE) between the metal contact and CdZnTe exerts thermal stress at the metal/CZT interface, which causes mechanical degradation of the contact in addition to the poor adhesion of the metallic thin film to CZT. To form a reliable and stable interface, the contact material should have better adhesion and a close match of the coefficients of thermal expansion with CZT/CdTe. Here, we report on our investigations of a novel non-metallic contact layer for use in radiation detector applications. The proposed ZnO:Al contact layer offers better adhesion due to the oxide interface, higher hardness and better matching of the CTE with CZT. It has high prospects for a reliable and stable device structure that can serve as a replacement to the common metallic electrodes used today. We evaluated AZO contacts to CZT and extracted the electronic characteristics, such as resistivity and mobility-lifetime product of electrons, and compared the results of the same characterization measurements for CZT with gold contacts. The present observations showed that the characteristics of CZT detectors with AZO contacts are nearly identical to the same detectors with gold contacts.