ASIC-based event-driven 2D digital electron counter for TEM imaging

Fan, G.Y.; Datte, P.; Beuville, E.; Beche, J.-F.; Millaud, J.; Downing, Kenneth H.; Burkard, F.; Ellisman, Mark H.; Xuong, Nguyen‐Huu

doi:10.1016/s0304-3991(97)00109-5

Cited by 22 publications

(13 citation statements)

References 15 publications

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“…Implementation of counting is easier in hybrid pixel sensors (HPSs) that are obtained by connecting a pixellated silicon detector with separate readout electronics by bump bonding. Operation of counting HPSs allows virtually noiseless creation of images; however, pixel sizes are usually in the order of a few tens of mm and construction of the detector requires troublesome bump bonding [6][7][8]. HPSs represent amount of material (readout chip, high Z material bump bonds, etc.)…”

Section: Introductionmentioning

confidence: 99%

Direct electron imaging in electron microscopy with monolithic active pixel sensors

et al. 2007

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Section: Introductionmentioning

confidence: 99%

Direct electron imaging in electron microscopy with monolithic active pixel sensors

et al. 2007

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“…For example, large-pixel, silicon-based detectors are under development for high energy physics experiments and for x-ray crystallography, and have also been tested for electron microscopy. 16 These devices provide a singleelectron signal that is well above the noise background, so that the SNR is extremely high. The dynamic range can be well above 10 6 .…”

Section: Introductionmentioning

confidence: 99%

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Downing

Mooney²

2008

Review of Scientific Instruments

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Electron microscopists are increasingly turning to intermediate voltage electron microscopes ͑IVEMs͒ operating at 300-400 kV for a wide range of studies. They are also increasingly taking advantage of slow-scan charge coupled device ͑CCD͒ cameras, which have become widely used on electron microscopes. Under some conditions, CCDs provide an improvement in data quality over photographic film, as well as the many advantages of direct digital readout. However, CCD performance is seriously degraded on IVEMs compared to the more conventional 100 kV microscopes. In order to increase the efficiency and quality of data recording on IVEMs, we have developed a CCD camera system in which the electrons are decelerated to below 100 kV before impacting the camera, resulting in greatly improved performance in both signal quality and resolution compared to other CCDs used in electron microscopy. These improvements will allow high-quality image and diffraction data to be collected directly with the CCD, enabling improvements in data collection for applications including high-resolution electron crystallography, single particle reconstruction of protein structures, tomographic studies of cell ultrastructure, and remote microscope operation. This approach will enable us to use even larger format CCD chips that are being developed with smaller pixels.

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“…In the process, we also observed a high dynamic range for imaging, with linear response from our minimum tested exposure of 0.225 e − /pixel to more than 1500× this value at 342 e − /pixel. Indeed, the dynamic range of direct electron detection for a typical cryo-EM exposure should be even higher than for a CCD, since the signal from the direct detector is continually read and integrated in software, rather than being hardware integrated in pixels wells over the entire exposure time (Fan et al, 1998). …”

Section: Discussionmentioning

confidence: 99%

Direct electron detection yields cryo-EM reconstructions at resolutions beyond 3/4 Nyquist frequency

Bammes

Rochat

Jakana

et al. 2012

Journal of Structural Biology

139

115

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One limitation in electron cryo-microscopy (cryo-EM) is the inability to recover high-resolution signal from the image-recording media at the full-resolution limit of the transmission electron microscope. Direct electron detection using CMOS-based sensors for digitally recording images has the potential to alleviate this shortcoming. Here, we report a practical performance evaluation of a Direct Detection Device (DDD) for biological cryo-EM at two different microscope voltages: 200 and 300 kV. Our DDD images of amorphous and graphitized carbon show strong per-pixel contrast with image resolution near the theoretical sampling limit of the data. Single-particle reconstructions of two frozen-hydrated bacteriophages, P22 and ε15, establish that the DDD is capable of recording usable signal for 3-D reconstructions at about 4/5 of the Nyquist frequency, which is a vast improvement over the performance of conventional imaging media. We anticipate the unparalleled performance of this digital recording device will dramatically benefit cryo-EM for routine tomographic and single-particle structural determination of biological specimens.

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ASIC-based event-driven 2D digital electron counter for TEM imaging

Cited by 22 publications

References 15 publications

Direct electron imaging in electron microscopy with monolithic active pixel sensors

Direct electron imaging in electron microscopy with monolithic active pixel sensors

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Direct electron detection yields cryo-EM reconstructions at resolutions beyond 3/4 Nyquist frequency

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