1986
DOI: 10.1070/pu1986v029n05abeh003386
|View full text |Cite
|
Sign up to set email alerts
|

Ascending diffusion and the diffusion aftereffect

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
9
0
6

Year Published

2007
2007
2020
2020

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 25 publications
(18 citation statements)
references
References 8 publications
0
9
0
6
Order By: Relevance
“…Actually, since only layered media exhibited intermittent tracks, the origin of those tracks has been assumed to be related to the intrinsic atomic layer structure of the material. [23][24][25][26][27] Irradiations were carried out at GANIL ͑Caen, France͒ using a Pb ion beam with an energy of 0.63 MeV/ u delivered by the beam line IRRSUD, under an angle of 1°with respect to the SiO 2 surface. The corresponding electronic linear energy transfer ͑LET elec ͒ was about 15.5 keV/ nm in SiO 2 , according to the SRIM2003 code.…”
Section: Discontinuous Ion Tracks On Silicon Oxide On Silicon Surfacementioning
confidence: 99%
“…Actually, since only layered media exhibited intermittent tracks, the origin of those tracks has been assumed to be related to the intrinsic atomic layer structure of the material. [23][24][25][26][27] Irradiations were carried out at GANIL ͑Caen, France͒ using a Pb ion beam with an energy of 0.63 MeV/ u delivered by the beam line IRRSUD, under an angle of 1°with respect to the SiO 2 surface. The corresponding electronic linear energy transfer ͑LET elec ͒ was about 15.5 keV/ nm in SiO 2 , according to the SRIM2003 code.…”
Section: Discontinuous Ion Tracks On Silicon Oxide On Silicon Surfacementioning
confidence: 99%
“…It follows from experimental data and theoretical calculations that at a corresponding direction of the built-in electric field the "uphill" impurity diffusion is really observed [26,27]. The "uphill" diffusion is also observed under conditions of significant elastic stresses that influence the diffusion of mobile species (the Gorsky effect [28,29]). However, in the case under consideration the "uphill" diffusion component is due to the so-called fictitious thermodynamic forces [30,31,32] that qualitatively differ from the real forces acting on mobile particles.…”
Section: The Equation Describing the Radiation-enhanced Diffusion Of ...mentioning
confidence: 99%
“…Для решения задачи об определении межфаз-ных напряжений нужно рассмотреть периоди-ческую ячейку '/ γ γ -микроструктуры, состоя-щую из ' возникающие вследствие разницы коэффициентов термического расширения фаз. Кинетика ва-кансий определяется диффузионным уравнением с источником вакансий по термактивационному механизму с учетом диффузионных и термических напряжений, а также концентрации напряже-ний возле включений [7][8][9][10][11]. Межфазные (когерентные) напряжения в '/ γ γ -микроструктуре не-деформированных жаропрочных никелевых сплавов возникают из-за разности параметров γ -и ' γ -решеток.…”
unclassified
“…Диффузионные напряжения возникают вследствие неравных встречных потоков атомов компонентов. В первом приближении в линейной теории упругости суммарные напряжения будут определяться выражением [5][6][7][8] …”
unclassified
See 1 more Smart Citation