2019
DOI: 10.1007/978-3-030-33582-3_35
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Artificial Intelligence Techniques for Predicting the Flashover Voltage on Polluted Cup-Pin Insulators

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Cited by 8 publications
(4 citation statements)
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“…It is observed that the flashover voltage has a greater effect on composite insulators than on porcelain insulators under uniform contamination. Non-uniformity of contamination has been investigated on the bottom and top along with the insulator leakage distance [8]. As suggested by [8], a significant influence in the flashover voltage (FOV) value caused by the uneven pollution degree (bottom/top), appeared to be about 28%-30% which is greater than FOV with the uniform contamination type.…”
Section: Introductionmentioning
confidence: 97%
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“…It is observed that the flashover voltage has a greater effect on composite insulators than on porcelain insulators under uniform contamination. Non-uniformity of contamination has been investigated on the bottom and top along with the insulator leakage distance [8]. As suggested by [8], a significant influence in the flashover voltage (FOV) value caused by the uneven pollution degree (bottom/top), appeared to be about 28%-30% which is greater than FOV with the uniform contamination type.…”
Section: Introductionmentioning
confidence: 97%
“…Non-uniformity of contamination has been investigated on the bottom and top along with the insulator leakage distance [8]. As suggested by [8], a significant influence in the flashover voltage (FOV) value caused by the uneven pollution degree (bottom/top), appeared to be about 28%-30% which is greater than FOV with the uniform contamination type. According to [9], the flashover voltage stress on the porcelain insulator strings is reduced by raising the non-uniformity level of the fan-shaped non-uniform pollution.…”
Section: Introductionmentioning
confidence: 97%
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“…Salem et al [22] combined Adaptive Neuro Fuzzy Inference System (ANFIS) with ANN and used insulator height, diameter, form factor, creepage distance along with Equivalent Salt Deposit Density (ESDD) as input parameters to train the model. In Reference [23], the authors applied dimensional analysis to the proposed ANFIS-based ANN network by establishing a relationship between critical flashover voltage and leakage current. The arc constant of the mathematical model for obtaining the test data was optimized using a Genetic Algorithm (GA) for improved results.…”
Section: Introductionmentioning
confidence: 99%