Artifact for "BDDs Strike Back - Efficient Analysis of Static and Dynamic Fault Trees"
Daniel Basgöze,
Matthias Volk,
Joost-Pieter Katoen
et al.
Abstract:Fault trees are a key model in reliability analysis. Classical static fault trees (SFT) can best be analysed using binary decision diagrams (BDD). State-based techniques are favorable for the more expressive dynamic fault trees (DFT). This paper combines the best of both worlds by following Dugan's approach: dynamic sub-trees are analysed via model checking Markov models and replaced by basic events capturing the obtained failure probabilities. The resulting SFT is then analysed via BDDs. We implemented this a… Show more
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