Argon ion-irradiation effects at the interface of Cu/Fe bilayers

Abstract

Cu/Fe layers produced by molecular beam epitaxy were subjected to 360 keV Ar + irradiation at 180 K and 295 K over a range of ion fluences from 2.0 ×10 15 to 5.0 ×10 16 ions cm −2 . Rutherford backscattering spectrometry and x-ray diffraction were used to monitor the evolution of the interfaces after each step of irradiation. Up to fluences of approximately 5 × 10 15 Ar + cm −2 , at both substrate temperatures, a moderate decrease of the initial Cu edge variance was observed. At higher fluences an inter-diffusion of the layers was noticed. The results are interpreted as being caused by stress effects and plastic deformation.