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2019
DOI: 10.1016/j.addma.2018.11.013
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Areal topography measurement of metal additive surfaces using focus variation microscopy

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Cited by 62 publications
(50 citation statements)
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“…There are investigations into employing areal parameters, which aim to more adequately capture AM surface information, such as Sa, the areal counterpart of Ra [117]. Regarding instrumentation, XCT has been used to extract areal parameters from AM surfaces, however, only from planar surfaces, as in references [118][119][120].…”
Section: Discussion Of Measurement Methodsmentioning
confidence: 99%
“…There are investigations into employing areal parameters, which aim to more adequately capture AM surface information, such as Sa, the areal counterpart of Ra [117]. Regarding instrumentation, XCT has been used to extract areal parameters from AM surfaces, however, only from planar surfaces, as in references [118][119][120].…”
Section: Discussion Of Measurement Methodsmentioning
confidence: 99%
“…Fracture surface analysis was performed by Macek [ 34 , 35 , 39 ] using an optical 3D test stand that facilitated the acquisition of data sets at a high depth of focus [ 45 , 46 ]. The failed specimens were observed under 10× magnification using an Alicona G4 InfiniteFocus (Alicona Imaging GmbH, Graz, Austria) as described previously [ 47 ].…”
Section: Materials and Methods Of Measurementmentioning
confidence: 99%
“…Fracture surface analysis was performed using an optical 3D test stand facilitating the acquisition of data sets at a high depth of focus [43,44]. The failed specimens were observed under 10x magnification using an Alicona G4 InfiniteFocus accordingly to the procedure described in the previous work [45].…”
Section: Surface Parameter Measurement and Calculationmentioning
confidence: 99%