Area Overhead and Power Analysis of March Algorithms for Memory BIST

Singh, Balwinder; Khosla, Arun; Narang, Sukhleen Bindra

doi:10.1016/j.proeng.2012.01.947

Cited by 5 publications

(1 citation statement)

References 10 publications

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“…The regulator's plan is of much assistance in developing a total MBIST motor to examine the adequacy of the planned calculation in segregating SAFs from TFs. Singh et al (2011) have actualized a FSM-based memory which is programmable worked as an individual test (MBIST) Organizer, which aids the testing of retention gadgets. The MBIST regulator intended for executing a novel assessment calculation called as March based assessment calculation.…”

Section: Related Workmentioning

confidence: 99%

Architecture for an efficient MBIST using modified March-y algorithms to achieve optimized communication delay and computational speed

Nisha¹,

Sivasankar

2021

IJPCC

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Purpose In this work, an efficient architecture for memory built in self-test (MBIST) that incorporates a modified March Y algorithm using concurrent technique and a modified linear feedback shift register (LFSR)–based address generator is proposed. Design/methodology/approach Built in self-test (BIST) is emerging as the essential ingredient of the system on chip. In the ongoing high speed, high tech sophistication technology of the very large-scale integrated circuits, testing of these memories is a very tedious and challenging job, since the area overhead, the testing time and the cost of the test play an important role. Findings With the efficient service of the adapted architecture, switching activity is considerably cut down. As the switching activity is in direct proportion to the power consumed scaling down, the switching process of the address generator inevitably leads to the reduction in power consumption of the MBIST. Originality/value To improve the yield and fault tolerance of on-chip memories without degradation on its performance self-repair mechanisms can be implemented on chip.

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Section: Related Workmentioning

confidence: 99%