Area-driven partial reconfiguration for SEU mitigation on SRAM-based FPGAs

Abstract

Abstract-This paper presents an area-driven FieldProgrammable Gate Array (FPGA) scrubbing technique based on partial reconfiguration for Single Event Upset (SEU) mitigation. The proposed method is compared with existing techniques such as blind and on-demand scrubbing on a novel SEU mitigation framework implemented on the ZYNQ platform, supporting various SEU and scrubbing rates. Our solution achieves 22% higher availability on average with 13% less data transfers from a Double Data Rate Type 3 (DDR3) memory when compared with a blind scrubbing approach for a second order polynomial evaluation function. The comparison with an existing on-demand scrubbing technique shows that our approach has 35% lower area with a 4.7% lower availability for the same case study.