Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?

Williamson, R. B.; Lj, Brereton; Antognozzi, Massimo; Miles, Mervyn J

doi:10.1016/s0304-3991(97)00078-8

Cited by 23 publications

(13 citation statements)

References 20 publications

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“…The blue layer indicates a thin water film as may be present on the sample under ambient conditions. understood [19], with a variety of mechanisms being discussed [103][104][105][106]. It has been suggested [107,108] that the tip experiences viscous damping from a thin water layer adsorbed on the surface of the sample under ambient conditions [108][109][110].…”

Section: Methodsmentioning

confidence: 99%

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

2007

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The fundamental mechanisms of tipenhanced Raman spectroscopy (TERS) have been investigated, including the role of the plasmonic excitation of the metallic tips, the nature of the optical tip-sample coupling, and the resulting local-field enhancement and confinement responsible for ultrahigh resolution imaging down to just several nanometers. Criteria for the distinction of near-field signature from far-field imaging artifacts are addressed. TERS results of molecules are presented. With enhancement factors as high as 10 9 , single-molecule spectroscopy is demonstrated. Spatially resolved vibrational mapping of crystalline nanostructures and determination of crystallographic orientation and domains is discussed making use of the symmetry properties of the tip scattering response and the intrinsic Raman selection rules.

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Section: Methodsmentioning

confidence: 99%

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

2007

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“…The current performances of an aperture SNOM, while always remaining well below the diffraction limit are in the tenths of nanometer range [2]. Improving the resolution is hampered by several factors including the tip size, the effect of metal coating as well as the control of tip sample distance, relative position and a detailed knowledge of the actual geometry [3,4]. Moreover, some challenging applications, including analysis of living biological samples, require imaging in liquid environment which can add further complications to the measurement.…”

Section: Introductionmentioning

confidence: 99%

A novel tapping SNOM: Specifications and performances

Longo

Girasole

Cricenti

2005

Physica Status Solidi (b)

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“…We can excite its relaxation oscillations by applying voltage pulse. When apex is approached to sample, the shear forces (atomic forces) [25][26][27] between the moving parts of the probe and sample surface increase the attenuation and change frequency of vibration. This apex vibration would generate microwave wave according to distance changing between two charge metallic strips (dipole oscillations).…”

Section: Applicationmentioning

confidence: 99%

Theoretical investigation for improvement of scanning near-field optical microscope

Lapchuk

Kryuchin

2002

SPIE Proceedings

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A near-field optical microscope on the basis of two trapeziform metallic strips on the surface of a dielectric cone is investigated 1 . It is shown that such construction of a near-field probe significantly improved the optical efficiency of a near-field microscope.The field distribution in the vicinity of probe apex is investigated for this probe and for the usual SNOM probe. On the basis of mathematical simulation it was shown that this type of a near-field microscope is promising for use in optical information recording with pit length less than 200 nm and also for using as optical heating element in magnetic information recording. The construction of a near field microscope for information recording is proposed on the basis of this near-field microscope and a solid immersion lens 2 .The model of a near field strips probe with cleaved apex is proposed. A method of checking the distance between a probe and the surface on the basis of exciting mechanical vibration of cleaved apex by voltage step is offered. The oscillation amplitude and their attenuation are determined by measuring high-frequency electromagnetic oscillation, which are excited by oscillation of opposite charges at the apex of a probe. The investigation was carried out on the basis of a mathematical model and an experiment is needed for full investigation.

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Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?

Cited by 23 publications

References 20 publications

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

Tip-Enhanced Raman Imaging and Nanospectroscopy: Sensitivity, Symmetry, and Selection Rules

A novel tapping SNOM: Specifications and performances

Theoretical investigation for improvement of scanning near-field optical microscope

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