Aproximación a un modelo para analizar la tecnología diagnóstica en las diferentes fases de su ciclo de vida soportado en un sistema de gestión por procesos

Padilla, Jair Asir Villanueva

doi:10.24275/uami.x059c749g

DOI: 10.24275/uami.x059c749g

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Aproximación a un modelo para analizar la tecnología diagnóstica en las diferentes fases de su ciclo de vida soportado en un sistema de gestión por procesos

Jair Asir Villanueva Padilla

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Aproximación a un modelo para analizar la tecnología diagnóstica en las diferentes fases de su ciclo de vida soportado en un sistema de gestión por procesos

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