Approach to the clustering modeling for the strong correlative control measurements for estimation of percent of the suitable integrated circuits in the semiconductor industry

Ershov, Ivan A.; Stukach, Oleg V.

doi:10.1109/dynamics.2016.7819007

2016 Dynamics of Systems, Mechanisms and Machines (Dynamics) 2016

DOI: 10.1109/dynamics.2016.7819007

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Approach to the clustering modeling for the strong correlative control measurements for estimation of percent of the suitable integrated circuits in the semiconductor industry

Ivan A. Ershov

Oleg V. Stukach

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et al. 2023

2023 7th International Conference on Information, Control, and Communication Technologies (ICCT)

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Approach to the clustering modeling for the strong correlative control measurements for estimation of percent of the suitable integrated circuits in the semiconductor industry

Cited by 5 publications

References 1 publication

Simulation Model for Controlling the Processing of Information Packets by a NoC Router

Simulation Model for Controlling the Processing of Information Packets by a NoC Router

Model of the Yield Loss Factors Based on Survey Analysis for the Integrated Circuits Manufacturing

Interrelation of metrology, testing and quality in semiconductor production

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