Abstract:In this study, the authors focus mainly on the investigation of Kriging interpolation method to elaborate surrogate models of the nanoscale double-gate metal oxide silicon field effect transistors (DG MOSFET) analogue/RF performance under critical operational conditions. The elaboration of such models is made possible through the generation of computer experiments using ATLAS-2D simulator, where the numerical simulations or experimental measurements, account for the accurate behaviour of the device including t… Show more
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