2003
DOI: 10.1016/s0168-9002(03)01640-1
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Applying X-rays in material analysis

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“…XRR is based on measuring the scattering from the layer and the substrate that differ in their density. This method provides information about layer thickness and density [ 31 , 32 ]. The parameters of the layer were found by fitting the experimental reflectometric curves to the theoretical curves [ 33 ].…”
Section: Methodsmentioning
confidence: 99%
“…XRR is based on measuring the scattering from the layer and the substrate that differ in their density. This method provides information about layer thickness and density [ 31 , 32 ]. The parameters of the layer were found by fitting the experimental reflectometric curves to the theoretical curves [ 33 ].…”
Section: Methodsmentioning
confidence: 99%