2016
DOI: 10.15376/biores.11.2.mou
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Applications of ToF-SIMS in surface chemistry analysis of lignocellulosic biomass: A review

Abstract: Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass. In the current article, the application of ToF-SIMS to the characterization of the surface chemical composition and distribution of biomass components in lignocelluloses is reviewed. Moreover, extended applications of ToF-SIMS in the study of pretreatments, mo… Show more

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Cited by 9 publications
(6 citation statements)
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“…With knowledge of the flight path and the electrical potential, and assuming unit charge, the mass of the ion can be determined. Furthermore, the ToF mass analyzer can discriminate between ions with excellent mass resolving power 15–20 . The surface under analysis is not significantly etched by the primary beam, but the technique can be paired with a secondary beam (dual sputter gun) to perform a depth profiling analysis.…”
Section: Overview Of Tof‐simsmentioning
confidence: 99%
See 1 more Smart Citation
“…With knowledge of the flight path and the electrical potential, and assuming unit charge, the mass of the ion can be determined. Furthermore, the ToF mass analyzer can discriminate between ions with excellent mass resolving power 15–20 . The surface under analysis is not significantly etched by the primary beam, but the technique can be paired with a secondary beam (dual sputter gun) to perform a depth profiling analysis.…”
Section: Overview Of Tof‐simsmentioning
confidence: 99%
“…Furthermore, the ToF mass analyzer can discriminate between ions with excellent mass resolving power. [15][16][17][18][19][20] The surface under analysis is not significantly etched by the primary beam, but the technique can be paired with a secondary beam (dual sputter gun) to perform a depth profiling analysis. ToF-SIMS therefore provides surface-sensitive analysis of a wide range of atomic and molecular fragment ions, and this is particularly useful for the analysis of polymeric and organic materials.…”
Section: Introductionmentioning
confidence: 99%
“…Mou et al 50 investigated After being treated with 30% (w/w) sodium xylene sulfonate and 2% (w/w) formic acid at 160°C for 90 minutes, the milling moso bamboo samples had an 8:1 solid to liquor ratio (S/L). 15% (w/w) fresh SXS was used to wash the solid substrate following pretreatment.…”
Section: Hydrotropic Pretreatmentmentioning
confidence: 99%
“…There are different methods based on ion spectroscopy, e.g., low [medium] energy ion spectroscopy (LEIS, MEIS), Rutherford backscattering spectrometry (RBS), or secondary ion mass spectroscopy (SIMS) [187]. Ion spectroscopy measures important structural information and investigates the surface chemical composition of biomass or related fields [193].…”
Section: X-ray Spectroscopymentioning
confidence: 99%
“…Water content [184] Ash content [184] Calorific value [184] Elemental content [141, 173, 175, 176, 178-183] [140, 151, 177] [79, 136, 157, 165-171, 173-176] [162-164, 172] Other parameters [143, 174, 186, 189] [75, 79, 136, 163, 185, 188] Electron/ion spectroscopy Other parameters [75,79,186,192,193] also on the rapid determination of the chemical composition, as this is an important aspect for the quality assessment of the fuel and the estimation of different plant reactions. However, they are still rather in the development stage compared to M, A, and Q.…”
Section: X-ray Spectroscopymentioning
confidence: 99%