1989
DOI: 10.1117/12.969609
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Applications Of Step-Scan Interferometry

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Cited by 5 publications
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“…The use of S 2 FT-IR PAS for spectral depth profiling has been developed during the past 8 years. Since the step-scan mode allows the interferogram to be measured point-by-point, while the optical path difference is held constant, the time dependence of the interferogram is eliminated. This allows a single modulation frequency to be applied to all wavelengths, in contrast to the wavelength-dependent Fourier frequencies of the conventional continuous-scan FT-IR method.…”
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confidence: 99%
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“…The use of S 2 FT-IR PAS for spectral depth profiling has been developed during the past 8 years. Since the step-scan mode allows the interferogram to be measured point-by-point, while the optical path difference is held constant, the time dependence of the interferogram is eliminated. This allows a single modulation frequency to be applied to all wavelengths, in contrast to the wavelength-dependent Fourier frequencies of the conventional continuous-scan FT-IR method.…”
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confidence: 99%
“…There are two basic approaches to PA spectral depth profiling: (1) variation of the modulation frequency and (2) analysis of the signal phase. Application of the modulation frequency variation method (by use of path difference, or phase, modulation) in S 2 FT-IR PA depth profiling of both continuously heterogeneous and discretely heterogeneous materials has been widely demonstrated. , However, with this method, the depth resolution is limited by the phase modulation frequency range and frequency selection of the instrument. Furthermore, with sine wave phase modulation, each frequency requires a separate scan.…”
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confidence: 99%