“…The LOD of other metallic elements was satisfactory for the detection of elements on insulators near factories and mines or near urban roads. In [ 36 ], Gondal studied the LOD of Na, Ca, Mn, etc. in cable via LIBS.…”
Section: Resultsmentioning
confidence: 99%
“…They obtained lower LOD of Na (589.59 nm) at 39.56 ppm and Mn (257.61 nm) at 4.2 ppm while obtained higher LOD of Ca (393.36 nm) at 43.2 ppm. The reason for the difference of Ca, Mn might be that the metal ions detected in this paper are all simple materials, while the components in [ 36 ] are compounds. Na, a kind of alkali metal, was greatly influenced by environment and instrument parameters, which resulted in great difference of experimental results.…”
The fast detection of classical contaminants and their distribution on high-voltage transmission line insulators is essential for ensuring the safe operation of the power grid. The analysis of existing insulator contamination has traditionally relied on taking samples during a power cut, taking the samples back to the lab and then testing them with elemental analysis equipment, especially for sugars, bird droppings, and heavy metal particulates, which cannot be analysed by the equivalent salt deposit density (ESDD) or non-soluble deposit density (NSDD) methods. In this study, a novel method called laser-induced breakdown spectroscopy (LIBS) offering the advantages of no sample preparation, being nearly nondestructive and having a fast speed was applied for the analysis of metal contamination. Several LIBS parameters (laser energy and delay time) were optimized to obtain better resolution of the spectral data. The limit of detection (LOD) of the observed elements was obtained using a calibration curve. Compared to calibration curves, multivariate analysis methods including principal component analysis (PCA), k-means and partial least squares regression (PLSR) showed their superiority in analyzing metal contamination in insulators. Then, the elemental distribution of natural pollution was predicted using LIBS to fully capture information about the bulk elements (Na, Ni, Cu, Mn, Ca, etc.) of entire areas with PLSR. The results showed that LIBS could be a promising method for accurate direct online quantification of metal contamination in insulators.
“…The LOD of other metallic elements was satisfactory for the detection of elements on insulators near factories and mines or near urban roads. In [ 36 ], Gondal studied the LOD of Na, Ca, Mn, etc. in cable via LIBS.…”
Section: Resultsmentioning
confidence: 99%
“…They obtained lower LOD of Na (589.59 nm) at 39.56 ppm and Mn (257.61 nm) at 4.2 ppm while obtained higher LOD of Ca (393.36 nm) at 43.2 ppm. The reason for the difference of Ca, Mn might be that the metal ions detected in this paper are all simple materials, while the components in [ 36 ] are compounds. Na, a kind of alkali metal, was greatly influenced by environment and instrument parameters, which resulted in great difference of experimental results.…”
The fast detection of classical contaminants and their distribution on high-voltage transmission line insulators is essential for ensuring the safe operation of the power grid. The analysis of existing insulator contamination has traditionally relied on taking samples during a power cut, taking the samples back to the lab and then testing them with elemental analysis equipment, especially for sugars, bird droppings, and heavy metal particulates, which cannot be analysed by the equivalent salt deposit density (ESDD) or non-soluble deposit density (NSDD) methods. In this study, a novel method called laser-induced breakdown spectroscopy (LIBS) offering the advantages of no sample preparation, being nearly nondestructive and having a fast speed was applied for the analysis of metal contamination. Several LIBS parameters (laser energy and delay time) were optimized to obtain better resolution of the spectral data. The limit of detection (LOD) of the observed elements was obtained using a calibration curve. Compared to calibration curves, multivariate analysis methods including principal component analysis (PCA), k-means and partial least squares regression (PLSR) showed their superiority in analyzing metal contamination in insulators. Then, the elemental distribution of natural pollution was predicted using LIBS to fully capture information about the bulk elements (Na, Ni, Cu, Mn, Ca, etc.) of entire areas with PLSR. The results showed that LIBS could be a promising method for accurate direct online quantification of metal contamination in insulators.
“…3. The shoulder is due to continuum emission by free-free bremsstrahlung and electron-ion recombination [35] in the SP versus the DP configuration. Figure 4 elucidates the recorded intensity of the SP and DP emission of the Si I (288.16) nm spectral line at h = 45°detection angle and laser focus position at 4.7 mm behind the surface for different delay times between the excitation laser pulse and the detection ICCD gate pulse.…”
Two Nd:YAG lasers working in pulsed modes are combined in the same direction (collinear arrangement) to focus on silicon (Si) crystals in reduced oxygen atmosphere (0.1 mbar) for double-pulse laser-induced breakdown spectroscopy (DP-LIBS) system. Silicon crystals of (100) and (111) orientations were investigated, and Si samples were measured either without prior treatment (''untreated'') or after fabrication of nano-pores (''treated''). Nano-pores are produced by metal coating and by chemical etching. DP-LIBS spectra were compared for different Si samples (untreated, treated, (100) and (111) orientations), for double-pulse (DP) (with 266 nm pulse followed by 1064 nm pulse) excitation and for different delay times (times between the excitation laser pulse and the detection ICCD gate); treatment by chemical etching has been studied as well. The intensity of the atomic line Si I at 288.16 nm was enhanced by a factor of about three by using the DP-LIBS signals as compared to the single-pulse (SP) signal which could increase the sensitivity of the LIBS technique. This study proved that an optimized value of the etching time of Si during etching by chemical processes and short delay times are required. Plasma parameters [the electron temperature (T e ) and the electron number density (N e )] were calculated from measured SP-and DP-LIBS spectra. The most important result of this study is the much higher DP-LIBS intensity observed on Si (100) as compared to Si (111) for measurements under the same experimental conditions. This study could provide important reference data for the design and optimization of DP-LIBS systems involved in plasma-facing components diagnostics.
“…Reviews, overviews and CRMs. The determination of Pu isotope ratios and of 241 Am in a reference fallout material was described by Zheng et al 180 The material had been collected from 14 different stations across Japan over the time period spanning 1963-1979. The results from a total digestion and an acid leach were compared to determine whether or not there was a difference in Pu isotopic composition between the two methods.…”
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