Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults

Prabhu, M. Santhosh; Abraham, Jacob A.

doi:10.1109/test.2013.6651915

Cited by 1 publication

(1 citation statement)

References 27 publications

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“…To avoid the need for a tester that can apply functional test sequences, the sequences can be applied from an onchip memory as in the case of software-based self-test approaches [5][6][7][8]. Recent interest in functional test sequences can be seen from [9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Reconstruction of a functional test sequence for increased fault coverage

Pomeranz

2017

IET Computers & Digital Techniques

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Simulation-based sequential test generation procedures address the high computational complexity of sequential test generation by replacing the deterministic branch-and-bound process with lower-complexity processes. These processes introduce new primary input patterns into a functional test sequence in order to increase its fault coverage. This study observes that, even without introducing new primary input patterns, it is possible to increase the fault coverage of a functional test sequence by applying the same primary input patterns in different orders. This is referred to as reconstruction of the sequence. It provides a new low-complexity option for increasing the fault coverage, and thus addressing the high computational complexity of sequential test generation. This study describes a reconstruction procedure that is based on repeating short subsequences of primary input patterns from the sequence. Experimental results demonstrate the effectiveness of the reconstruction procedure in increasing the fault coverage as part of a simulation-based sequential test generation procedure.

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Section: Introductionmentioning

confidence: 99%

Reconstruction of a functional test sequence for increased fault coverage

Pomeranz

2017

IET Computers & Digital Techniques

View full text Add to dashboard Cite

show abstract

Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults

Cited by 1 publication

References 27 publications

Reconstruction of a functional test sequence for increased fault coverage

Reconstruction of a functional test sequence for increased fault coverage

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