Application of ultramicrotomy and infrared imaging to the forensic examination of automotive paint

Abstract

In several previously published studies, Lavine and coworkers have demonstrated that infrared (IR) spectra from all layers of an intact multilayered automotive paint chip can be collected in a single analysis by scanning across each layer of a cross sectioned paint chip using a Fourier transform IR imaging microscope. Applying alternating least squares to the spectral data, the IR spectrum of each layer of an original equipment manufacturer paint chip can be extracted from a line map of the spectral image. To further develop this imaging technique for automotive paint analysis, the capability to cross section “small” paint chips (1 mm or less) using an ultramicrotome has been incorporated into our current imaging methodology. An ultramicrotome does not require epoxy or other embedding media for the paint chip and will simplify the analysis. However, extracting the IR spectra for each layer of an original equipment manufacturer paint chip by alternating least squares can be problematic for thin peels (less than one micron thickness), necessitating the use of target testing factor analysis to determine whether a specific layer is present in the line map and modified alternating least squares to recover the IR spectrum of the layer. Using a new sample preparation technique and the appropriate multivariate curve resolution methods, high quality IR spectra of the layers of a modern automotive paint system can be obtained from paint fragments that are smaller than what is practical to analyze by conventional Fourier transform IR spectroscopy.