Application of the PIXE method to organic objects

Vodopivec, Jedert; Budnar, M.; Pelicon, Primož

doi:10.1016/j.nimb.2005.06.227

Cited by 15 publications

(8 citation statements)

References 4 publications

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“…The parchment samples used in this study were prepared from fresh calfskin as described later on in the materials and methods section. The parchment samples were irradiated with an external proton micro-beam (2.3 MeV, beam size 100 × 100 µm 2 ) with beam fluences between 0.5 and 10 µC/cm 2 corresponding to measurement conditions reported in the literature 20 , 38 , 39 , although in some cases even considerably higher deposited charge per area was applied 20 , 40 , 41 . The range up to 10 µC/cm 2 was defined as low beam fluence range and no alterations could be observed below 1 µC/cm 2 in PIXE studies on paint layers 7 .…”

Section: Introductionmentioning

confidence: 99%

Proton beam irradiation induces invisible modifications under the surface of painted parchment

Müller

Szikszai

Csepregi

et al. 2022

Sci Rep

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Ion beam analysis plays an important role in cultural heritage (CH) studies as it offers a combination of simultaneous and complementary analytical techniques (PIXE/PIGE/RBS) and spatially resolved mapping functions. Despite being considered non-destructive, the potential risk of beam-induced modifications during analysis is increasingly discussed. This work focuses on the impact of proton beams on parchment, present in our CH in form of unique historical manuscripts. Parchment is one of the organic, protein-based CH materials believed to be the most susceptible to radiation-induced changes. Various modification patterns, observed on parchment cross-sections by optical and electron microscopy are reported: discoloration (yellowing), formation of cavities and denaturation of collagen fibers. Considerable modifications were detected up to 100 µm deep into the sample for beam fluences of 4 µC/cm2 and higher. The presence of ultramarine paint on the parchment surface appears to increase the harmful effects of proton radiation. Based on our results, a maximum radiation dose of 0.5 µC/cm2 can be considered as ‘safe boundary’ for 2.3 MeV PIXE analysis of parchment under the applied conditions.

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Section: Introductionmentioning

confidence: 99%

Proton beam irradiation induces invisible modifications under the surface of painted parchment

Müller

Szikszai

Csepregi

et al. 2022

Sci Rep

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“…The resulting X-ray and backscattered particle spectra are used to determine the elemental composition of the sample. Ion beam analysis techniques are well established for detection of surface treatments on materials of historical interest, including parchments (see Vodopivec et al, 2005). Moreover, these techniques are nondestructive, which is necessary for analysing valuable manuscripts.…”

Section: Introductionmentioning

confidence: 99%

A flock of sheep, goats and cattle: ancient DNA analysis reveals complexities of historical parchment manufacture

Campana

Bower

Bailey

et al. 2010

Journal of Archaeological Science

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“…Since then, reviews of this technique inevitably mention its application for analysis of historical printed documents (Johanson, 1989(Johanson, , 1992Demortier, 1991;Pillay, 2000;Vijayan et al, 2003;Vodopivec et al, 2005).…”

Section: Proton-induced X-ray Emission Spectrometrymentioning

confidence: 99%

Proceedings of the First International Symposium on Analytical Methods in Philately

Lera¹,

Barwis²,

Herendeen³

2013

Smithsonian Contributions to History and Technology

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Smithsonian Institution Scholarly Press s m i t h s o n i a n c o n t r i b u t i o n s t o h i s t o r y a n d t e c h n o l o g y • n u m b e r 5 7Proceedings of the First International Symposium on Analytical Methods in Philately In these series, the Institution publishes small papers and full-scale monographs that report on the research and collections of its various museums and bureaus. The Smithsonian Contributions Series are distributed via mailing lists to libraries, universities, and similar institutions throughout the world.Manuscripts submitted for series publication are received by the Smithsonian Institution Scholarly Press from authors with direct affiliation with the various Smithsonian museums or bureaus and are subject to peer review and review for compliance with manuscript preparation guidelines. General requirements for manuscript preparation are on the inside back cover of printed volumes. For detailed submissions requirements and to review the "Manuscript Preparation and Style Guide for Authors," visit the Submissions page at www.scholarlypress.si.edu. s m i t h s o n i a n c o n t r i b u t i o n s to h i s to ry a n d t e c h n o l o g y • n u m b e r 5 7Proceedings Readers will find insights to research methods used across the entire spectrum of philatelic interests, from composition and physical characteristics of paper, to the chemistry and mineralogy of printing ink, to determining the genuineness of stamps, overprints, and the uses of adhesives on cover. Some of these projects were funded in part by the Institute for Analytical Philately and the National Postal Museum. The rights to text and images in this publication, including cover and interior designs, are owned either by the Smithsonian Institution, by contributing authors, or by third parties. Fair use of materials is permitted for personal, educational, or noncommercial purposes. Users must cite author and source of content, must not alter or modify copyrighted content, and must comply with all other terms or restrictions that may be applicable. Users are responsible for securing permission from a rights holder for any other use.

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Application of the PIXE method to organic objects

Cited by 15 publications

References 4 publications

Proton beam irradiation induces invisible modifications under the surface of painted parchment

Proton beam irradiation induces invisible modifications under the surface of painted parchment

A flock of sheep, goats and cattle: ancient DNA analysis reveals complexities of historical parchment manufacture

Proceedings of the First International Symposium on Analytical Methods in Philately

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