International Optical Design Conference and Optical Fabrication and Testing 2010
DOI: 10.1364/oft.2010.jmb47p
|View full text |Cite
|
Sign up to set email alerts
|

Application of the NANOMEFOS Non-contact Measurement Machine in Asphere and Freeform Optics Production

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2012
2012
2022
2022

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. Comparing the measurements of selected asphere and freeform surfaces is important in order to allow the performance of these measuring systems to be assessed.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. Comparing the measurements of selected asphere and freeform surfaces is important in order to allow the performance of these measuring systems to be assessed.…”
Section: Introductionmentioning
confidence: 99%
“…As mentioned above, many measurement systems exist that use different measurement principles. For example, certain instruments apply optical [6][7][8][9] or tactile [4][5][6] point sensors that allow different scanning paths on the surface to be used. Often, spiral scans [7], circular scans [2] or line scans [4,5] are used, depending on the construction of the machine and on the sensor paths chosen by the customer.…”
Section: Introductionmentioning
confidence: 99%