Abstract:The application of a method of phase-amplitude functions for the calculation of reflectograms obtained during the reflection of neutrons and X-rays from planar nanostructures is considered. Several approximations and substitutions that can be useful for different problems are described. It is shown that this method can be used to calculate reflectivity curves with lower computational expenditures than in the case of other approaches. A comparison between model numerical results for different algorithms is give… Show more
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