1958
DOI: 10.1063/1.1723393
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Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low-Energy Electron Diffraction

Abstract: It should also be emphasiZed that rubber is not ideally elastic, especially in, the region of strain approaching breaking point, and the analogy with brittle fracture, although useful'in that it may lead to an explanation of the observed maximum speeds of perfectly smooth crack propagation, could be misleading if the slightest step formation occurred at high strains since the consequent energy dissipation could be very much greater than for glass.In this respect a better analogy is with anelastic materials suc… Show more

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Cited by 222 publications
(12 citation statements)
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“…A Ni(110) single crystal was used as the substrate, cleaned in situ before each experiment by a combination of chemical (O 2 and H 2 treatments) and physical (sputtering-annealing cycles) procedures until the surface was deemed cleaned by CO or H 2 TPD. Sputtering was followed by annealing at high temperatures (;1100 K) to regain the smooth nature of the single-crystal flat (110) surface, as established by others in the past [36,37]. The UHV chamber used in these experiments is also equipped with an hemispherical electron energy analyzer and an aluminum-anode (hm 5 1486.6 eV) X-ray source, used to acquire XPS to further check on the cleanliness of the sample.…”
Section: Methodsmentioning
confidence: 99%
“…A Ni(110) single crystal was used as the substrate, cleaned in situ before each experiment by a combination of chemical (O 2 and H 2 treatments) and physical (sputtering-annealing cycles) procedures until the surface was deemed cleaned by CO or H 2 TPD. Sputtering was followed by annealing at high temperatures (;1100 K) to regain the smooth nature of the single-crystal flat (110) surface, as established by others in the past [36,37]. The UHV chamber used in these experiments is also equipped with an hemispherical electron energy analyzer and an aluminum-anode (hm 5 1486.6 eV) X-ray source, used to acquire XPS to further check on the cleanliness of the sample.…”
Section: Methodsmentioning
confidence: 99%
“…43 To remove this layer and other contaminations a cleaning procedure has been developed using a bombardment with argon ions and subsequent annealing in an ultra-high vacuum. 18 It has been shown by measurements of field effect and surface conductivity that this cleaning method produces extremely p-type surfaces (G = 2 x 10-4 ohm-1) even on n-type crystals (inversion layer, fig. l(c) and fig.…”
Section: Oxygen and Hydrogen On Germaniummentioning
confidence: 99%
“…(i) Slow-electron diffraction 17 determines the surface spacing and changes of the surface structure upon exposure to ambients. (ii) The investigation of the ejection patterns of atoms sputtered from crystal surfaces under ion bombardment.…”
Section: Imperfections In the Surface Structure Of Semiconductorsmentioning
confidence: 99%