2005
DOI: 10.1364/ol.30.002930
|View full text |Cite
|
Sign up to set email alerts
|

Application of the homogenization approximation to rough one-dimensional photonic crystals

Abstract: As previously reported [Opt. Lett. 29, 2791 (2004)], one-dimensional photonic crystals exhibit a decrease in their normal reflectivity if their interfaces are not flat. We show that the homogenization approximation accurately predicts this diminished optical response by comparing results with finite-difference time-domain (FDTD) simulations applied to the same roughened structures. Within the parameter range tested (rms roughness < 20% and rms wavelengths < 100% of the photonic crystal periodicity), the homoge… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
6
0

Year Published

2006
2006
2020
2020

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(6 citation statements)
references
References 3 publications
0
6
0
Order By: Relevance
“…During QC laser processing there are two main fabrication steps that introduce waveguide side-wall roughness, (i) photolithographic pattern transfer where roughness is introduced due to imperfections in the photolithography mask and/or sample surface and irregularities created in the photoresist pattern while developing, and (ii) dry etching, where roughness is introduced due to material degradation induced by high-ion energy plasma and slow etching rates. Several studies on the effects of surface roughness on performance of optical devices have been conducted in the fields of Si/SiO 2 waveguides for shorter near-infrared (near-IR) wavelengths of 0.63-1.63 μm [1][2][3][4][5], Si-and III-V-based microdisk resonators [6][7][8][9], and photonic crystal structures [10][11][12][13]. Recently we reported on a study on determining the effects of side-wall roughness on QC laser performance parameters, such as threshold current density and slope efficiency for the longer mid-IR wavelengths of 7-12 μm [14]; here we review this work and extend the study by showing the effects of waveguide side-wall roughness on the far-field beam pattern and group refractive index of the waveguides.…”
Section: Introductionmentioning
confidence: 99%
“…During QC laser processing there are two main fabrication steps that introduce waveguide side-wall roughness, (i) photolithographic pattern transfer where roughness is introduced due to imperfections in the photolithography mask and/or sample surface and irregularities created in the photoresist pattern while developing, and (ii) dry etching, where roughness is introduced due to material degradation induced by high-ion energy plasma and slow etching rates. Several studies on the effects of surface roughness on performance of optical devices have been conducted in the fields of Si/SiO 2 waveguides for shorter near-infrared (near-IR) wavelengths of 0.63-1.63 μm [1][2][3][4][5], Si-and III-V-based microdisk resonators [6][7][8][9], and photonic crystal structures [10][11][12][13]. Recently we reported on a study on determining the effects of side-wall roughness on QC laser performance parameters, such as threshold current density and slope efficiency for the longer mid-IR wavelengths of 7-12 μm [14]; here we review this work and extend the study by showing the effects of waveguide side-wall roughness on the far-field beam pattern and group refractive index of the waveguides.…”
Section: Introductionmentioning
confidence: 99%
“…Until recently, the real optical behavior of such structures was not easily predictable using traditional techniques, such as the transfer matrix method. 6 However, in several recent papers, 7,8 we have proposed a method to predict the normal incidence reflectivity of rough 1DPCs using the homogenization approximation 9 in conjunction with the transfer matrix technique. As of yet, this theory has not been verified through comparison with experimental data.…”
mentioning
confidence: 99%
“…Therefore, traditional simulation techniques, such as one-dimensional transfer matrix, 6 cannot be used to accurately predict the real optical behavior of this structure directly. Thus, we have used our previously proposed method 7,8 to calculate the theoretical reflectivity spectrum of this structure at normal incidence. This was done by using a modified version ͑to account for the dispersion of the glass slide͒ of the code in Appendix A of Ref.…”
mentioning
confidence: 99%
See 2 more Smart Citations