Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO_4)-=SUB=-2-=/SUB=- and NaNd(MoO_4)-=SUB=-2-=/SUB=- Ceramics Irradiated with High-Energy Ions

Abstract

The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO_4)2 and NaNd(MoO_4)2 ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO_4)2 ceramics to external radiation exposure as compared to NaNd(WO_4)2 has been demonstrated. Keywords: X-ray diffraction, Parallel beam method, Grazing incidence geometry, Ion irradiation, Ceramics, Radiation resistance, Amorphization, Damaged layer.