Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects

Morniroli, J. P.; Cappellen, E. Van; Zuo, Jian‐Min; Spence, John C. H.

doi:10.1051/mmm:1997114

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Application of the Convergent Beam Imaging (CBIM) Technique to the Analysis of Crystal Defects

Cited by 4 publications

References 14 publications

Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction

Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction

Calcium diffusivity in alumino-silicate garnets: an experimental and ATEM study

Chapter 95 Dislocations in Minerals

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