Application of Synchrotron X‐Radiation to Problems in Materials Science

Gerson, Andrea R.; Halfpenny, P. J.; Pizzini, S.; Ristić, R. I.; Sheen, D. B.; Sherwood, J. N.

doi:10.1002/9783527613748.ch2

Cited by 4 publications

(2 citation statements)

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“…We briefly remark on the use of Soller slits in powder EDXRD, which are used to measure larger volumes (millimetre to centimetre size) without reducing the angular resolution [37,38]. Typical dimensions of a Soller slit system are 50 slits of 100 µm width separated by stainless steel foils of 50 µm thickness [39], leading to a sensitive area of about 50 µm × 100 µm × 100 µm for a 100 µm wide x-ray beam.…”

Section: Adjustment Of the Samplementioning

confidence: 99%

In situenergy-dispersive x-ray diffraction system for time-resolved thin-film growth studies

Ellmer

Mientus²,

Wei

et al. 2003

Meas. Sci. Technol.

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Energy-dispersive x-ray diffraction (EDXRD) with synchrotron light can be used for in situ-structural analysis during polycrystalline thin-film growth, due to its fast data collection and the fixed diffraction angle. An in situ deposition and analysis set-up for the investigation of nucleation and growth of thin films during magnetron sputtering was constructed and installed at the synchrotron radiation source Hamburger Synchrotronstrahlungs Labor (Hamburg). The polychromatic synchrotron beam passes the sputtering chamber through Kapton windows and hits the substrate with the growing film. The diffracted beam, observed under a fixed diffraction angle of between 1 • and 10 • was energy-analysed by a high-purity germanium detector. The measurement time for a single XRD spectrum can be as short as 10 s for a beam line at a bending magnet, which allows a time-resolved monitoring of film growth.The performance of the in situ EDXRD set-up is demonstrated for the growth of zinc oxide and tin-doped indium oxide films prepared by reactive magnetron sputtering from ceramic and metallic targets. From the position and the width of the diffraction lines the internal mechanical strain and the grain size of the growing films can be derived. The prospects for thin-film growth investigations using such an instrument are assessed.

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Section: Adjustment Of the Samplementioning

confidence: 99%

In situenergy-dispersive x-ray diffraction system for time-resolved thin-film growth studies

Ellmer

Mientus²,

Wei

et al. 2003

Meas. Sci. Technol.

View full text Add to dashboard Cite

show abstract

“…For example, cryogenic treatment of steels results in improved wear resistance but there exist contradictory theories as to why. Application of the 3D-microdiffraction fluorescence probe will enable a complete understanding of the strain, phase transformations and crystallite size distributions induced on cryogenic treatment of steels [12] and the correlation of these microcrystalline properties to bulk physical properties.…”

Section: Selected Applicationsmentioning

confidence: 99%