Application of spectral statistics to surface defect detection

Abstract

The development of a spectral difference-based statistical processing of hyperspectral images is provided in this article. Kullback-Leibler pseudo-divergence function, which was specifically developed for the metrological processing of hyperspectral images, is used at the foundation of the statistics. As a demonstration of its use, the proposed statistics are used in visualising surface variability within a set of pigment patches. It is then further exploited to detect anomalies and deterioration that occur on the patches.