1972
DOI: 10.1016/0030-4018(72)90030-2
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Application of speckling for measuring the deflection of laser light by phase objects

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Cited by 72 publications
(19 citation statements)
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“…18,19 A special case is the estimation of a plasma density profile for fusion plasma devices and measuring the laser deflection by phase objects. 20,21 Previously mentioned methods treat light refraction effects and schlieren measurements mostly qualitatively, although they do report about using Abel's transformation for the diagnostics. However, in these cases, the problem to separate the effects of gas temperature and density of charge particles in the plasma remains unsolved.…”
Section: Introductionmentioning
confidence: 99%
“…18,19 A special case is the estimation of a plasma density profile for fusion plasma devices and measuring the laser deflection by phase objects. 20,21 Previously mentioned methods treat light refraction effects and schlieren measurements mostly qualitatively, although they do report about using Abel's transformation for the diagnostics. However, in these cases, the problem to separate the effects of gas temperature and density of charge particles in the plasma remains unsolved.…”
Section: Introductionmentioning
confidence: 99%
“…The BOS technique can best be compared with laser speckle density photography as described by Debrus et al (1972) and Köpf (1972) and the improved versions by Wernekinck and Merzkirch (1987) and Viktin and Merzkirch (1998). Like most interferometric techniques, laser speckle density photography preferably utilizes an expanded parallel laser beam, which traverses a compressible flow field or (in more general terms) passes through an object of varying refractive index (i.e., a phase object).…”
Section: Bos Theorymentioning
confidence: 99%
“…The technique is based on the distortion of one image, due to density changes, compared to an undistorted reference image. This approach can best be compared with laser speckle density photography, as described by Køpf (1972) and Wernekink and Merzkirch (1987). The processing of the images is shown in Fig.…”
Section: Background-oriented Schlieren Measurementsmentioning
confidence: 99%