2022
DOI: 10.3390/s22072498
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Application of Moire Profilometry in Three-Dimensional Profile Reconstruction of Key Parts in Railway

Abstract: Moire profilometry (MP) is one of the three-dimensional (3D) topography measurement methods of structured light, which has the advantages of single frame reconstruction, high speed, no contact and high precision, and is suitable for dynamic measurement scenes. In this article, the digital MP is applied to the wheel tread measurement, the virtual grating is generated by computer to project to the object surface, the moire fringe pattern of the object is obtained by filtering, and finally the continuous phase pa… Show more

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Cited by 3 publications
(3 citation statements)
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“…There are growing demands and applications for fringe projection profilometry in the field of precise three-dimensional (3D) shape measurement [1][2][3][4][5][6]. A typical monocular fringe profile projection system consists of a projector and a camera.…”
Section: Introductionmentioning
confidence: 99%
“…There are growing demands and applications for fringe projection profilometry in the field of precise three-dimensional (3D) shape measurement [1][2][3][4][5][6]. A typical monocular fringe profile projection system consists of a projector and a camera.…”
Section: Introductionmentioning
confidence: 99%
“…When studying object motion, FTP may not meet the requirements for object reconstruction accuracy [ 15 , 16 ]. On the other hand, PSP is the most widely studied method and can obtain high robustness and high-precision pixel-wise phase unwrapping [ 17 , 18 ]. However, PSP may encounter difficulties when dealing with scenes that have dynamic motion, as the movement of objects can cause distortion in the phase, leading to errors.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, with the advancement of precision instruments and digital signal processing, the measurement accuracy of moiré fringe methods has been continuously improving. It has become a common technique for surface profiling and displacement measurement at the nanoscale [7,8] .…”
Section: Introductionmentioning
confidence: 99%