Application of Micro- and Nanobeams for Materials Science

Martı́nez-Criado, Gema

doi:10.1007/978-3-030-23201-6_46

Cited by 4 publications

(3 citation statements)

References 87 publications

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“…In recent years, high-flux hard X-ray probes with beam sizes in the micrometre and sub-micrometre range have become increasingly available at synchrotron sources. Thereby, nanodiffraction is finding more and more applications within the field of materials science (Ice et al, 2011;Martinez-Criado, 2015;Schu ¨lli & Leake, 2018). While X-ray nanoprobes enable a multitude of different techniques and applications, we will focus here on scanning diffraction experiments, where extended strain and stress fields, as well as microstructural features and cracking, in hard polycrystalline coatings are mapped.…”

Section: Introductionmentioning

confidence: 99%

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

Lotze,

Iyer,

Bäcke

et al. 2024

J Synchrotron Radiat

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The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60–70 nm at 14–16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.

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Section: Introductionmentioning

confidence: 99%

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

Lotze,

Iyer,

Bäcke

et al. 2024

J Synchrotron Radiat

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“…Bu anlamda trust'ın Kıta Avrupası hukuk sistemimde aynen benimsenememesi nedenlerinden ilki trust'ın kurulmasıyla parçalı bir mülkiyet yapısının oluşmasıdır 70 . Bu anlayış, faydalananın üçüncü kişiye ayni hakka dayalı talepte bulunabilmesi için zaruri olsa da Kıta Avrupası hukuk sistemi açısından mülkiyetin bölünmesi kabul edilebilir değildir 71 . Bu prensip bir eşya üzerinde birden fazla kişinin mülkiyet hakkına sahip olduğu birlikte mülkiyet hallerinde de mevcuttur 72 .…”

Section: A Mülkiyet Hakkının Bölünmezliği İlkesiunclassified

“…Türk mahkemesi kamu düzenine aykırılık nedeniyle Türk hukukuna yabancı olan bir kuruma ilişkin ihtilafı görmekten kaçınamayacaktır. Güvenilenin İngiliz trust hukuku kapsamında sahip olduğu yasal malik sıfatı trust konusu mal varlığını faydalanan lehine kullanabilmesi ve yönetebilmesi içindir 229 . Türk hukuku bakımından güvenilenin sahip olduğu bu hak mülkiyet hakkı olarak nitelendirilemeyecektir.…”

Section: Trust Müessesesinin Ayni Hak Olarak Vasıflandırılmasıunclassified

Trust Müessesesinin Karşılaştırmalı Hukuktaki Özellikli Durumu

2023

imuhfd

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Küreselleşmeyle trust müessesesi sadece Anglo-Amerikan hukuk sisteminin problemi olmaktan çıkmıştır. Türk hukuk sistemine yabancı olan bu müesseseye ilişkin bir uyuşmazlığın Türk hâkiminin huzuruna gelmesi halinde, bu ihtilafın milletlerarası özel hukuk bakımından çözülmesi problemi hasıl olacaktır. İlgili konuda Trust'lara Uygulanacak Hukuk ve Trust'ların Tanınmasına İlişkin 1985 Tarihli Lahey Konvansiyonu olsa da Türkiye bu Konvansiyona taraf değildir ve bu nedenle bu problem Türkiye açısından geçerliliğini sürdürmektedir.

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Alignment and use of microbeam with full-field x-ray microscopes

Shibazaki

Wakabayashi

Suzuki

et al. 2023

Review of Scientific Instruments

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Demonstration tests of the alignment of Fresnel zone plate focusing optics using a full-field x-ray microscope and microbeam x-ray diffraction measurements combined with the full-field x-ray microscope were performed. It was confirmed that the full-field x-ray microscope enables direct two-dimensional observation of a microbeam with sub-micrometer spatial resolution. This allowed visualization of the misalignment of the focusing optics, resulting in accurate alignment of the optics within a short time. In addition, the microscope could be used to observe the sample as well as the microbeam, which enabled clarification of the position and two-dimensional shape of the microbeam on the sample. This realized a measurement procedure that a 100- μm-size sample was imaged with sub-micrometer spatial resolution, and then, microbeam-use measurements were performed for only the region of interest determined by the microscope, which has been difficult with conventional microbeam applications. The combination of observations by a full-field x-ray microscope and measurements using a microbeam is expected to open a new style of measurement.

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Application of Micro- and Nanobeams for Materials Science

Cited by 4 publications

References 87 publications

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

Trust Müessesesinin Karşılaştırmalı Hukuktaki Özellikli Durumu

Alignment and use of microbeam with full-field x-ray microscopes

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