Application of Laser Deprocessing Technique in Physical Failure Analysis on Memory Bit-counting

Pan, Yutao; Zhao, Yuzhe; Tan, Puay Siew; Khoo, P.; Yeo, P.Y.; Ting, Seng Kiong; Tan, H.; Chen, Chang

doi:10.1109/ipfa47161.2019.8984871

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) 2019

DOI: 10.1109/ipfa47161.2019.8984871

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Application of Laser Deprocessing Technique in Physical Failure Analysis on Memory Bit-counting

Yutao Pan

Yuzhe Zhao

Puay Siew Tan

et al.

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Application of Laser Deprocessing Technique in Physical Failure Analysis on Memory Bit-counting

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