Abstract:Scatterometry is currently being used in lithography production as an inline metrology tool to monitor wafer processing and detect excursions. One well-documented excursion is the process variation caused by differences in resist batches. 1 This paper describes the use of Tokyo Electron Limited's integrated Optical Digital Profilometry (iODP TM ) scatterometry system to detect process variations caused by resist batch changes. This system was able to detect a significant shift in resist sidewall angle (SWA) on… Show more
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