Application of Infrared Non-destructive Defect Location in Components

Sun, Jian; Wang, Zhibin; Xie, Chenming; Duan, Chao; Li, Ting

doi:10.1109/iccsd.2019.8842947

2019 IEEE 3rd International Conference on Circuits, Systems and Devices (ICCSD) 2019

DOI: 10.1109/iccsd.2019.8842947

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Application of Infrared Non-destructive Defect Location in Components

Jian Sun

Zhibin Wang

Chenming Xie

et al.

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Application of Infrared Non-destructive Defect Location in Components

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