1995
DOI: 10.1541/ieejeiss1987.115.3_466
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Application of Image Analysis to High Resolution SEM Pictures on Pitch-based Carbon Fibers

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Cited by 3 publications
(2 citation statements)
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“…The relation between Df and the transfer function of the TEM image was investigated by integration of the power spectrum around its center, and it was shown that the image analysis method was effective for the analysis of TEM images. This analysis method can be used not only for TEM images but also for images of scanning microscopy and optical microscopy because the images can be treated identically once they are input into a computer [12,13].…”
Section: Discussionmentioning
confidence: 99%
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“…The relation between Df and the transfer function of the TEM image was investigated by integration of the power spectrum around its center, and it was shown that the image analysis method was effective for the analysis of TEM images. This analysis method can be used not only for TEM images but also for images of scanning microscopy and optical microscopy because the images can be treated identically once they are input into a computer [12,13].…”
Section: Discussionmentioning
confidence: 99%
“…From the results of the calculation of the power spectra, the frequency distribution versus Df was analyzed [8,9,12].…”
Section: Analysis Methodsmentioning
confidence: 99%