1974
DOI: 10.1154/s0376030800006790
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Application of Heavy Charged Particle Induced X-Ray Emission to the Trace Element Analysis of Human Tissue and Blood Serum

Abstract: Measurements of peak-to-background ratios for K x-ray production by 1.7 MeV/amu protons, alpha particles, carbon ions, and neon ions have been carried out for the purpose of determining the optimum projectile atomic number for particle induced x-ray emission analysis. The feasibility of applying the method to the trace element analysis of thick samples of tissue and blood serum has been explored.

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Cited by 4 publications
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“…The feasibility of multielement analysis can be evaluated by comparing the K and L x-ray yields for the different projectile energies given in Figure 5 with the corresponding pattern for the background (Figure 3). Considering the data presented in Figure 5, the following features become apparent: for a given projectile energy the production of K and L x rays follows the same trend as Z varies; still more interesting is the observation that the yields of K and L x rays of similar energies are about the same for identical excitation conditions (nature and energy of projectile), e.g., for a beam of 2 MeV/amu, the K x-ray yield for P ( » = 2 keV) is about the same as the L x-ray yield for 2r (El = 2.1 keV). For this reason,…”
Section: Resultsmentioning
confidence: 95%
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“…The feasibility of multielement analysis can be evaluated by comparing the K and L x-ray yields for the different projectile energies given in Figure 5 with the corresponding pattern for the background (Figure 3). Considering the data presented in Figure 5, the following features become apparent: for a given projectile energy the production of K and L x rays follows the same trend as Z varies; still more interesting is the observation that the yields of K and L x rays of similar energies are about the same for identical excitation conditions (nature and energy of projectile), e.g., for a beam of 2 MeV/amu, the K x-ray yield for P ( » = 2 keV) is about the same as the L x-ray yield for 2r (El = 2.1 keV). For this reason,…”
Section: Resultsmentioning
confidence: 95%
“…A considerable amount of work has been devoted in recent years to charged particle induced x-ray emission as a multielement trace analysis method. Most studies thus far have involved proton or a excitation and have focused on the optimization of experimental parameters for maximum measurement sensitivity and the application of the technique to a variety of samples including air filters and biological specimens (e.g., [1][2][3][4][5][6]. In this context proton excitation applied on thin samples is considered to provide the best analytical results, i.e., high sensitivity (as low as ~10"7 g/g for Ep ~2-4 MeV) coupled with broad elemental coverage (1)(2)(3)(4)(5)(6).…”
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