Application of Genetic Algorithms in the Determination of Dielectric Properties of Materials at Microwave Frequencies

Díaz‐Morcillo, Alejandro; Monzó‐Cabrera, Juan; Requena-Perez, M.E.; Guerrero, Antonio José Lozano

doi:10.1007/978-3-540-73055-2_63

Cited by 3 publications

(1 citation statement)

References 2 publications

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“…More generally, an inverse scattering approach can be applied, where synthetic scattering parameters are generated with a full-wave simulation model for given sample shape and permittivity. The true complex permittivity can then be found by optimization, as demonstrated in several recent papers [Díaz-Morcillo et al, 2007;Requena-Pérez et al, 2006;Kilic et al, 2010Kilic et al, , 2011Kilic et al, , 2012aKilic et al, , 2012b.…”

Section: Introductionmentioning

confidence: 99%

Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

Sjöberg

Larsson

2015

Radio Sci.

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We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The method is based on measuring the S parameters for three different orientations of a rectangular sample block in a rectangular waveguide. The corresponding geometries are modeled in a commercial full-wave simulation program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S parameters. The information added by the different sample orientations is quantified using the Cramér-Rao lower bound. The flexibility of the method allows the determination of material parameters of an arbitrarily shaped sample that fits in the waveguide.

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Section: Introductionmentioning

confidence: 99%

Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

Sjöberg

Larsson

2015

Radio Sci.

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A Self-Gap-Correction Method for Accurate Permittivity Measurement Using the Hybrid Optimization Algorithm

Liang

Gao

2019

IEEE Trans. Instrum. Meas.

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Planar Transmission Line Method for Characterization of Printed Circuit Board Dielectrics

Zhang¹,

Koledintseva²,

Antonini³

et al. 2010

PIER

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Abstract-An effective approach to characterize frequency-dispersive sheet materials over a wide RF and microwave frequency range based on planar transmission line geometries and a genetic algorithm is proposed. S-parameters of a planar transmission line structure with a sheet material under test as a substrate of this line are measured using a vector network analyzer (VNA). The measured S-parameters are then converted to ABCD matrix parameters. With the assumption of TEM/quasi-TEM wave propagation on the measured line, as well as reciprocity and symmetry of the network, the complex propagation constant can be found, and the corresponding phase constant and attenuation constant can be retrieved. Attenuation constant includes both dielectric loss and conductor loss terms. At the same time, phase term, dielectric loss and conductor loss can be calculated for a known transmission line geometry using corresponding closedform analytical or empirical formulas. These formulas are used to construct the objective functions for approximating phase constants, conductor loss and dielectric loss in an optimization procedure based on a genetic algorithm (GA). The frequency-dependent dielectric properties of the substrate material under test are represented as one or a few terms following the Debye dispersion law.The parameters of the Debye dispersion law are extracted using the GA by minimizing the discrepancies between the measured and the corresponding approximated loss and phase terms. The extracted data is verified by substituting these data in full-wave numerical modeling of structures containing these materials and comparing the simulated results with experimental.

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Application of Genetic Algorithms in the Determination of Dielectric Properties of Materials at Microwave Frequencies

Cited by 3 publications

References 2 publications

Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

Material characterization in partially filled waveguides using inverse scattering and multiple sample orientations

A Self-Gap-Correction Method for Accurate Permittivity Measurement Using the Hybrid Optimization Algorithm

Planar Transmission Line Method for Characterization of Printed Circuit Board Dielectrics

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