1996
DOI: 10.1080/095008396179986
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Application of electron channelling contrast to the investigation of strain localization effects in cyclically deformed fcc crystals

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Cited by 76 publications
(35 citation statements)
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“…Furthermore, the authors highlighted that this relatively simple and efficient technique has a supplementary character to TEM investigations due to its advantages of simple specimen preparation and large field of view. Few years later, Schwab et al [32] showed that dislocation glide localization phenomena like the "ladder-like" structure of dislocation walls in persistent slip bands (PSBs) occurring in nickel polycrystals after fatigue can be studied by the ECCI technique in a conventional SEM equipped with tungsten cathode and using the low-tilt ECCI configuration. Thus, it was possible to obtain statistically provided geometrical parameters (thickness of dislocation walls, thickness of dislocation free channels, etc.)…”
Section: Imaging Of Dislocation Arrangements After Fatiguementioning
confidence: 99%
“…Furthermore, the authors highlighted that this relatively simple and efficient technique has a supplementary character to TEM investigations due to its advantages of simple specimen preparation and large field of view. Few years later, Schwab et al [32] showed that dislocation glide localization phenomena like the "ladder-like" structure of dislocation walls in persistent slip bands (PSBs) occurring in nickel polycrystals after fatigue can be studied by the ECCI technique in a conventional SEM equipped with tungsten cathode and using the low-tilt ECCI configuration. Thus, it was possible to obtain statistically provided geometrical parameters (thickness of dislocation walls, thickness of dislocation free channels, etc.)…”
Section: Imaging Of Dislocation Arrangements After Fatiguementioning
confidence: 99%
“…This technique not only can provide a real and wide view of dislocation substructures conveniently, but also makes it possible to establish the relationship between dislocation arrangements and crystallographic characterization of the deformed crystals. In particular, the dislocation arrangements at some special sites, such as PSBs [36][37][38], grain boundaries (GBs) [40,41,43] and the front of the crack [42,44], can be successfully revealed by this technique. Thus, in the present work, the ECC technique was utilized to examine the dislocation arrangements near fatigue cracks and within DBs over the whole surface of the crystal specimen.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, in the present study, a typical singleslip oriented crystal was employed to avoid the activation of secondary slip systems, and the investigation was focused on the fatigue cracking mechanism within DBs. Meanwhile, the electron channeling contrast (ECC) technique in conventional scanning electron microscopy (SEM) has received much interest in studying dislocation arrangements in deformed materials [35][36][37][38][39][40][41][42][43]. This technique not only can provide a real and wide view of dislocation substructures conveniently, but also makes it possible to establish the relationship between dislocation arrangements and crystallographic characterization of the deformed crystals.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, it needs special preparation of thin foils and cutting the specimen. Using the channelling contrast of backscattered electrons in a scanning electron microscope (SEM) [1,2] allows dislocation distributions to be imaged on larger areas containing several grains. Promising techniques are those which can combine high resolution analysis of plastic deformation marks and large areas of analysis with a high number of grains at different locations of the specimen without destroying the specimen.…”
Section: Introductionmentioning
confidence: 99%