Application of calibrated and reusable probes on a home-made scanning probe microscope platform
Rui Xu,
Yi Liu,
Zhimu Yang
et al.
Abstract:The replacement of an Atomic Force Microscope (AFM) probe is inevitable due to blunting or contamination of its tip during usage. The fabrication of AFM probes is a complex and costly process, and the mechanical properties of these probes need to be calibrated due to material defects before use, making this procedure intricate. Taking inspiration from the Wollaston probe, we have developed a T-shaped tungsten probe and installed it into a home-made scanning probe microscope. The normal stiffness coefficient of… Show more
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