Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Sobola, Dinara; Ţălu, Ştefan; Sadovsky, Petr; Papěž, Nikola; Grmela, Lubomír

doi:10.15598/aeee.v15i3.2242

Cited by 20 publications

(16 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Pure imaging of surface topography in this case is insufficient and numerical processing is demanded for description of differences in the samples [17][18][19][20][21][22]. The stereometric analysis was carried out on the basis of AFM data, because it gives real 3D information about surface texture [23][24][25][26][27][28]. The surface topography was described in terms of stereometric analysis using the SPIP TM 6.7.4 Graphical representation of Abbott-Firestone curve computed for images from Fig.…”

Section: Resultsmentioning

confidence: 99%

Stereometric analysis of Ta₂O₅ thin films

Sobola

Kaspar

Oulehla

et al. 2020

Materials Science-Poland

Self Cite

View full text Add to dashboard Cite

The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin films and their three-dimensional (3D) micromorphology. The samples were prepared on silicon substrates by electron beam evaporation. The differences in surface structure of the processed and reference samples were investigated. Compositional studies were performed by energy-dispersive X-ray spectroscopy. Stereometric analysis was carried out on the basis of atomic force microscopy (AFM) data, for tantalum pentoxide samples with 20 nm, 40 nm, 60 nm, 80 nm and 100 nm thicknesses. These methods are frequently used in describing experimental data of surface nanomorphology of Ta2O5. The results can be used to validate theoretical models for prediction or correlation of nanotexture surface parameters.

show abstract

Section: Resultsmentioning

confidence: 99%

Stereometric analysis of Ta₂O₅ thin films

Sobola

Kaspar

Oulehla

et al. 2020

Materials Science-Poland

Self Cite

View full text Add to dashboard Cite

show abstract

“…It is important to note that there are many studies about thin films that have tried to understand 3D complex surface morphology through atomic force microscopy (AFM) measurements (Elenkova et al, 2015;Méndez et al, 2015;Sobola et al, 2017) using stereometric analysis (Ţălu et al, 2015a;Stach et al, 2015Stach et al, , 2017, fractal and multifractal geometry (Arman et al, 2015;Ţălu et al, 2014, 2015b, 2016a, 2019, and power spectral density functions (Arman et al, 2015;Gong et al, 2016). However, articles that use such analyses on other types of surfaces, such as plant leaves, are rare.…”

Section: Introductionmentioning

confidence: 99%

Advanced Microtexture Study of Anacardium occidentale L. Leaf Surface From the Amazon by Fractal Theory

2020

View full text Add to dashboard Cite

This work applies stereometric parameters and fractal theory to characterize the structural complexity of the 3D surface roughness of Anacardium occidentale L. leaf using atomic force microscopy (AFM) measurements. Surface roughness was studied by AFM in tapping mode, in air, on square areas of 6,400 and 10,000 μm2. The stereometric analyses using MountainsMap Premium and WSXM software provided detailed information on the 3D surface topography of the samples. These data showed that the morphology of the abaxial and adaxial side of the cashew leaf is different, which was also observed in relation to their microtextures. Fractal analysis showed that the adaxial and abaxial sides have strong microtexture homogeneity, but the adaxial side presented higher surface entropy. These results show that image processing associated with fractal theory can be an indispensable tool for identifying plant species by their leaves because this species has singularities on each side of the leaf.

show abstract

“…Numerical methods applied to the propagation of light wave in dependence on structure provided the opening into optical structural analysis of biological nanostructures (Alieva & Agullo‐Lopez, ). Studies of butterfly wings themselves were performed with the focus on the geometrical structure measured by atomic force microscopy with further data analysis (Garczyk, Stach, Talu, Sobola, & Wróbel, ) and by applying mathematical formulae of fractal analysis to the structure (Sobola, Talu, Sadovsky, Papez, & Grmela, ; Ţălu, ; Talu, Morozov, Sobola, & Škarvada, ). Very interesting approach to topology analysis was also done on moiré from scanning electron microscopy (Kishimoto, Wang, Xie, & Zhao, ).…”

Section: Introductionmentioning

confidence: 99%

Analysis of color shift on butterfly wings by Fourier transform of images from atomic force microscopy

Kaspar

Sobola

Sedlák

et al. 2019

Microscopy Res & Technique

Self Cite

View full text Add to dashboard Cite

Butterfly wings have complex structure lending it several interesting properties.Coloration of the wing is one of the first things to encounter and the overall visual effect is in fact influenced by several factors. Chemical pigments set the base color of the wing, topographical structures on the wing scales cause color shift by interference and their arrangement into diffraction grating causes iridescence. The thin film interference can be attributed to microscopic ridges covering wing scales. Observation and calculation of the color shift on wings of Euploea mulciber species using Fourier transform of images obtained by atomic force microscopy is the focus of this article. By using Fourier transform infrared spectroscopy it was established that both top and bottom sides of the wing of Euploea mulciber have the same chemical composition, even though they have different color. This change of color can be attributed to thin film interference, which was analyzed and calculated by using Fourier transform of images acquired by atomic force microscopy. K E Y W O R D S AFM, butterfly wing, Fourier transform, FTIR

show abstract

Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Cited by 20 publications

References 0 publications

Stereometric analysis of Ta₂O₅ thin films

Stereometric analysis of Ta₂O₅ thin films

Advanced Microtexture Study of Anacardium occidentale L. Leaf Surface From the Amazon by Fractal Theory

Analysis of color shift on butterfly wings by Fourier transform of images from atomic force microscopy

Contact Info

Product

Resources

About

Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Cited by 20 publications

References 0 publications

Stereometric analysis of Ta2O5 thin films

Stereometric analysis of Ta2O5 thin films

Advanced Microtexture Study of Anacardium occidentale L. Leaf Surface From the Amazon by Fractal Theory

Analysis of color shift on butterfly wings by Fourier transform of images from atomic force microscopy

Contact Info

Product

Resources

About

Stereometric analysis of Ta₂O₅ thin films

Stereometric analysis of Ta₂O₅ thin films