Applicability Problem in Characterization of Femtosecond Pulses with Spectral Phase Interferometry for Direct Electric-Field Reconstruction

Jun, 刘俊 Liu; Jinhui, 文锦辉 Wen; Yanwei, 张燕伟 Zhang; Zhongxing, 焦中兴 Jiao; Liang, 雷亮 Lei; Zhiling, 黄志凌 Huang; Zhifeng, 陈志峰 Chen; Tianshu, 赖天树 Lai

doi:10.3788/cjl20093605.1175

中国激光

2009

DOI: 10.3788/cjl20093605.1175

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Applicability Problem in Characterization of Femtosecond Pulses with Spectral Phase Interferometry for Direct Electric-Field Reconstruction

刘俊 Liu Jun¹,

文锦辉 Wen Jinhui²,

张燕伟 Zhang Yanwei³

et al.

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Applicability Problem in Characterization of Femtosecond Pulses with Spectral Phase Interferometry for Direct Electric-Field Reconstruction

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