Aortic Diseases

Dating Micrometre‐Thin Rims Using a LA‐ICP‐MS Depth Profiling Technique on Zircon from an Archaean Metasediment: Comparison with the SIMS Depth Profiling Method

“…First suggested by Zeitler and Williams (1988) and Zeitler et al (1989), early studies used the moderate sputtering rate of secondary ion mass spectrometry (SIMS; Grove and Harrison 1999, Carson et al 2002, Mojzsis and Harrison 2002, Breeding et al 2004, whereas more recent studies have begun to utilise (more readily available) laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS, e.g., Margetic et al 2001, Mason and Mank 2001, Eggins et al 2003, Woodhead et al 2004, Cottle et al 2009, 2012, Steely et al 2014. In particular, these developments have been moved forward through the application of depth profiling techniques on unpolished mineral grains.…”