2008
DOI: 10.1088/0022-3727/41/11/112001
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Antiferromagnetic grain volume effects in metallic polycrystalline exchange bias systems

Abstract: In this work we present a new interpretation of the role of the antiferromagnetic (AF) grain size in polycrystalline exchange bias thin films. It is found that at a finite temperature AF grains with sizes below a given critical volume VC do not contribute to the loop displacement because they are not thermally stable. There is a second critical volume VSET above which the AF grains cannot be set due to their anisotropy energy being too large. Therefore, only grains in the window between VC and VSET contribute … Show more

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Cited by 80 publications
(62 citation statements)
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“…This confirms the tendency observed from the buffer series in figure 3 (the larger the grains, the wider the distribution). Moreover, it is in accordance with the results obtained in the literature [8,9], which showed how an increase of the IrMn thickness leads to an increase of the grain volume and a broadening of the distribution. The range of measured grain volumes fits well with those presented in the cited studies, thus confirming the validity of the measuring method.…”
Section: Fig 2 Normalized Frequency Distribution For Buffer Layer Ssupporting
confidence: 92%
See 1 more Smart Citation
“…This confirms the tendency observed from the buffer series in figure 3 (the larger the grains, the wider the distribution). Moreover, it is in accordance with the results obtained in the literature [8,9], which showed how an increase of the IrMn thickness leads to an increase of the grain volume and a broadening of the distribution. The range of measured grain volumes fits well with those presented in the cited studies, thus confirming the validity of the measuring method.…”
Section: Fig 2 Normalized Frequency Distribution For Buffer Layer Ssupporting
confidence: 92%
“…In IrMn polycrystalline thin layers, an increase of the AF thickness causes an enhancement of the average grain lateral size and a broadening of its distribution [9]. It is also possible to tailor AF grain population by changing the sputtering rate [10], the process pressure [11], the annealing temperature [12,13] or the buffering layer [12][13][14][15].…”
Section: Methodology Of the Studymentioning
confidence: 99%
“…The precise size depends, for example, on sample preparation, thickness, and postdeposition annealing. Examples of grains sizes for CoO and IrMn can be found in Molina-Ruiz et al (2011) and Vallejo-Fernandez, Fernández-Outón, and O'Grady (2008), respectively.…”
Section: B Magnetic Phase Transition and Finite-size Scalingmentioning
confidence: 99%
“…From a more accurate observation of the temperature dependence, we emphasize that H B is very similar for all the samples at T = 7 K, with a sudden linear drop of this value for sample A up to T = 30 K. Assuming a granular character for our samples, this indicates that the size distribution of the AFM layer is strongly influenced by the Cu underlayer thickness. In fact, a thicker Cu layer may induce the presence of larger FeMn grains in the AFM layer which will be more magnetically stable at higher temperatures maintaining the exchange interaction with the upper FM layer [6]. In this respect, the linear drop at low temperature of the bias field for sample A must correspond to a significant small size component in its grain size distribution, not present in the other three samples.…”
Section: Joint European Magnetic Symposia 2012mentioning
confidence: 97%