2009
DOI: 10.1016/j.solmat.2009.02.014
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Another route to fabricate single-phase chalcogenides by post-selenization of Cu–In–Ga precursors sputter deposited from a single ternary target

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Cited by 75 publications
(29 citation statements)
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References 17 publications
(23 reference statements)
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“…The atomic ratio CGI = Cu/(Ga+In) of ca. 1.8 for the underlayer fits well to the copper-rich Cu 16 (In 1-y ,Ga y ) 9 phase. The top layer contains much more In than the underlayer and we hence expect In to be present as a mixed alloy along with the Cu-In-Ga phase(s).…”
Section: Precursor Characterizationsupporting
confidence: 53%
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“…The atomic ratio CGI = Cu/(Ga+In) of ca. 1.8 for the underlayer fits well to the copper-rich Cu 16 (In 1-y ,Ga y ) 9 phase. The top layer contains much more In than the underlayer and we hence expect In to be present as a mixed alloy along with the Cu-In-Ga phase(s).…”
Section: Precursor Characterizationsupporting
confidence: 53%
“…Indeed, our XRD measurements of a precursor indicate the existence of elemental indium as well as Cu 16 (In 1-y ,Ga y ) 9 and/or Cu 9 (In,Ga) 4 within the layer (see Fig. 2).…”
Section: Precursor Characterizationmentioning
confidence: 76%
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“…Additionally, its high thermal stability makes the use of post-deposition heat treatment to improve its performanc [1][2][3] .…”
Section: Introductionmentioning
confidence: 99%
“…CIGS thin films have been prepared by a variety of deposition methods including co-evaporation, sputtering, chemical spray pyrolysis and electrodeposition [2][3][4][5][6] . Among these, CIGS thin films prepared by co-evaporation have yielded the highest efficiency;…”
Section: Introductionmentioning
confidence: 99%