Anomaly detection using deep learning based model with feature attention
Rikin J. Nayak,
Jitendra P. Chaudhari
Abstract:<span lang="EN-US">Anomaly detection is a difficult problem with numerous industrial applications, such as analyzing the quality of objects using images. Anomaly detection is the process of identifying outliers in a given dataset. Recently, machine learning approaches to computer vision problems have outperformed classical state-of-the-art approaches. Anomaly detection problems can be solved using supervised approaches. However, labelled datasets are hard to obtain. Thus, many researchers have taken an u… Show more
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